Title:
DEVICE CAPABLE OF TESTING FLUORESCENCE SPECTRUM, AFTERGLOW AND FLUORESCENCE LIFETIME OF MATERIAL
Document Type and Number:
WIPO Patent Application WO/2020/232741
Kind Code:
A1
Abstract:
Disclosed is a device capable of testing the fluorescence spectrum, afterglow and fluorescence lifetime of a material, the device having the functions of testing the fluorescence spectrum, the afterglow and the fluorescence lifetime of the material. The device comprises a sample stage (5), an X-ray light source (2), a first light filter (4), a photon counter (9), a timer (10), a spectrometer (12), and a computer (11), wherein the sample stage (5), the X-ray light source (2) and the first light filter (4) are arranged inside a dark box (1); when the intensity of the fluorescence spectrum of a sample (6) is tested, the sample (6) is connected to the spectrometer (12) via an optical fiber (7), and the spectrometer (12) and the X-ray light source (2) are both electrically connected to the computer (11); when the afterglow of the sample (6) is tested, the sample (6) is connected to the photon counter (9) via the optical fiber (7), the photon counter (9) and the X-ray light source (2) are both electrically connected to the timer (10), and the timer (10) is electrically connected to the computer (11); and when the fluorescence lifetime of the sample (6) is tested, the first light filter (4) is arranged between the sample (6) and the photon counter (9), the first light filter (4) is connected to the photon counter (9) via the optical fiber (7), the photon counter (9) and the X-ray light source (2) are both electrically connected to the timer (10), and the timer (10) is electrically connected to the computer (11).
Inventors:
WANG SHUAO (CN)
CHEN LANHUA (CN)
WANG YAXING (CN)
CHEN LANHUA (CN)
WANG YAXING (CN)
Application Number:
PCT/CN2019/089406
Publication Date:
November 26, 2020
Filing Date:
May 31, 2019
Export Citation:
Assignee:
UNIV SOOCHOW (CN)
International Classes:
G01N23/223
Foreign References:
| US20140254752A1 | 2014-09-11 | |||
| US20090078874A1 | 2009-03-26 | |||
| CN203720112U | 2014-07-16 | |||
| CN1428603A | 2003-07-09 | |||
| CN108007906A | 2018-05-08 |
Other References:
MOSES, W. W. ET AL.: "Scintillator Characterization Using the LBL Pulsed X-ray Facility", RADIATION MEASUREMENTS, vol. 24, no. 4, 31 December 1995 (1995-12-31), XP027395338, DOI: 20200114160245X
Attorney, Agent or Firm:
CENTRAL SOUTH WELL INTELLECTUAL PROPERTY OFFICE (CN)
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