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Patent Searching and Data


Title:
DEVICE FOR THE CONTACTLESS AND NONDESTRUCTIVE TESTING OF SURFACES
Document Type and Number:
WIPO Patent Application WO/2011/137547
Kind Code:
A3
Abstract:
A device for the contactless and nondestructive testing of a surface by measuring the infrared radiation thereof has one or more incoherent electromagnetic radiation sources (1) and a detector (14) arranged on a detection axis (9), wherein the radiation sources (1) are arranged at a radial distance from the detection axis (9), at a distance from a testing area (7). In this arrangement, a pulsed or intensity-modulated excitation radiation (2) can be generated by these radiation sources (1) and applied to the surface (6) to be tested in the testing area (7) at an inclination to the detection axis (9) in the testing area (7). The detection radiation emitted by a measuring area (8) of the surface (6) to be tested can be fed to the detector (14), wherein the detector (14) is arranged on the detection axis (9) further away spatially from the testing area (7) than the radiation sources (1). Furthermore, an imaging device (10, 12) is provided on the detection axis (9) for creating an image of the testing area (7) on the measuring area of the detector (14) that is arranged between the radiation sources (1).

Inventors:
REINKE NILS (CH)
BARISKA ANDOR (CH)
Application Number:
PCT/CH2011/000097
Publication Date:
January 05, 2012
Filing Date:
May 02, 2011
Export Citation:
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Assignee:
WINTERTHUR INSTR GMBH (CH)
REINKE NILS (CH)
BARISKA ANDOR (CH)
International Classes:
G01N25/18; G01B11/06; G01B21/08; G01N21/00; G01N21/17; G02B13/14; G02B27/00; G01N25/72
Domestic Patent References:
WO1995016907A11995-06-22
Foreign References:
DE19830473C11999-12-23
US3206603A1965-09-14
US20080185520A12008-08-07
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