Title:
DEVICE FOR DETECTING IC NOISE RESISTANCE AMOUNT, METHOD FOR DETECTING IC NOISE RESISTANCE AMOUNT, AND METHOD FOR MEASURING INTERNAL IMPEDANCE OF IC
Document Type and Number:
WIPO Patent Application WO/2022/244246
Kind Code:
A1
Abstract:
A signal generation unit (10) outputs, as noise, a first AC signal and a second AC signal of different phases. A first coaxial cable (21) transmits the first AC signal. A second coaxial cable (22) transmits the second AC signal. A first probe (40) is connected to the first coaxial cable (21), is disposed in proximity to an IC (51) on a printed circuit board (50), and applies the first AC signal to the IC (51). A second probe (41) is connected to the second coaxial cable (22), is disposed in proximity to the IC (51), and applies the second AC signal to the IC (51). On the basis of the state of the IC (51) after application of the first AC signal and the second AC signal, a determination device (70) determines whether the IC (51) is operating erroneously.
Inventors:
YAMAKAJI YUSUKE (JP)
WASHINO MASAOMI (JP)
HARUNA NOBUYUKI (JP)
WASHINO MASAOMI (JP)
HARUNA NOBUYUKI (JP)
Application Number:
PCT/JP2021/019384
Publication Date:
November 24, 2022
Filing Date:
May 21, 2021
Export Citation:
Assignee:
MITSUBISHI ELECTRIC CORP (JP)
International Classes:
G01R27/02; G01R31/26; G01R31/30; G06F11/24; H01L21/64
Foreign References:
| JP2011041209A | 2011-02-24 | |||
| JP2003107116A | 2003-04-09 | |||
| JP2000314755A | 2000-11-14 | |||
| JPH04270969A | 1992-09-28 | |||
| JP2013137222A | 2013-07-11 | |||
| JP2004150840A | 2004-05-27 | |||
| JP2004085477A | 2004-03-18 | |||
| US20030160622A1 | 2003-08-28 |
Attorney, Agent or Firm:
FUKAMI PATENT OFFICE, P.C. (JP)
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