Title:
DEVICE FOR DETECTING PARALLELISM BETWEEN ROLL AND SUBSTRATE AND METHOD FOR ALIGNING PARALLELISM BY USING SAME
Document Type and Number:
WIPO Patent Application WO/2023/113447
Kind Code:
A1
Abstract:
The present invention related to a device capable of detecting a parallelism between a roll and a substrate and method for aligning a parallelism by using same, wherein a parallelism between a stamp and a substrate is precisely measured in a contactless manner, and a parallelism between a roll stamp and the substrate is assigned, thereby securing a highly-precise horizontal alignment between the roll stamp and the substrate.
Inventors:
KIM JAE-HYUN (KR)
JANG BONGKYUN (KR)
LIM HYUNG JUN (KR)
KIM HYEON-DON (KR)
LEE SEUNG-MO (KR)
JANG BONGKYUN (KR)
LIM HYUNG JUN (KR)
KIM HYEON-DON (KR)
LEE SEUNG-MO (KR)
Application Number:
PCT/KR2022/020287
Publication Date:
June 22, 2023
Filing Date:
December 13, 2022
Export Citation:
Assignee:
KOREA INST MACH & MATERIALS (KR)
International Classes:
G01B11/26; G02B5/08; G02B26/04; G02B27/10
Foreign References:
| KR100690882B1 | 2007-03-09 | |||
| KR100833116B1 | 2008-05-28 | |||
| JP2004101406A | 2004-04-02 | |||
| JP2020169952A | 2020-10-15 | |||
| KR101846514B1 | 2018-04-13 |
Attorney, Agent or Firm:
PANKOREA PATENT AND LAW FIRM (KR)
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