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Title:
DEVICE INSPECTION SYSTEM
Document Type and Number:
WIPO Patent Application WO/2019/107169
Kind Code:
A1
Abstract:
[Summary] [Problem] To provide this device inspection system which is capable of flexibly changing an inspection item or inspection details of a device by using a general-purpose terminal and a cloud. [Solution] When a two-dimensional code attached to a device 12 to be inspected is image-captured by a general-purpose terminal 20 to which data for maintenance and inspection is downloaded from a cloud 34, a component to be inspected is displayed on the general-purpose terminal 20. When a two-dimensional code attached to the component to be inspected is image-captured, inspection details are displayed. After inspection according to display details is terminated, the inspection result is transmitted to the cloud 34.

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Inventors:
NAKAMURA NAOHISA (JP)
KUSANO KOUICHI (JP)
MORIMOTO HIDEKI (JP)
Application Number:
PCT/JP2018/042282
Publication Date:
June 06, 2019
Filing Date:
November 15, 2018
Export Citation:
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Assignee:
SINTOKOGIO LTD (JP)
International Classes:
G05B23/02; B22C25/00
Foreign References:
JP2016501721A2016-01-21
JP2017194946A2017-10-26
JP2017174127A2017-09-28
JP2014238819A2014-12-18
JP2015076869A2015-04-20
JP2002049417A2002-02-15
JP2011103049A2011-05-26
JP2012035553A2012-02-23
Attorney, Agent or Firm:
YAMASAKI, Yukuzo et al. (JP)
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