DEVICE MANAGEMENT METHOD, ANALYSIS SYSTEM USED FOR THE SAME, MAINTENANCE INSPECTION SUPPORT METHOD, AND MAINTENANCE INSPECTION SUPPORT DEVICE USED FOR THE SAME

Title:

DEVICE MANAGEMENT METHOD, ANALYSIS SYSTEM USED FOR THE SAME, MAINTENANCE INSPECTION SUPPORT METHOD, AND MAINTENANCE INSPECTION SUPPORT DEVICE USED FOR THE SAME

Document Type and Number:

WIPO Patent Application WO/2007/013466

Kind Code:

A1

Abstract:

All-number diagnosis is periodically performed to inspect whether each of a plenty of management object devices T is normal or defective. Upon all-number diagnosis, diagnosis results Ic are recorded in a management database Db. If any device is found to be defective, the defective device is repaired or replaced. According to history information N on each of the management object devices T obtained from the diagnosis results Ic of the all-number diagnosis performed several times and recorded in the management database Db, each of the management object devices T is judged whether its type is appropriate or an appropriate type is selected.

Inventors:

FUJIWARA YOSHIYASU (JP)
ODA KAZUNORI (JP)

Application Number:

PCT/JP2006/314690

Publication Date:

February 01, 2007

Filing Date:

July 25, 2006

Export Citation:

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Assignee:

TLV CO LTD (JP)
FUJIWARA YOSHIYASU (JP)
ODA KAZUNORI (JP)

International Classes:

G07C3/08; G01M99/00; F16T1/48

Foreign References:

JP2002140745A	2002-05-17
JPS62246695A	1987-10-27
JP2003296475A	2003-10-17

Other References: