Title:
DEVICE MANAGEMENT METHOD, ANALYSIS SYSTEM USED FOR THE DEVICE MANAGEMENT METHOD, ANALYSIS DATA STRUCTURE, AND MAINTENANCE INSPECTION SUPPORT DEVICE USED FOR THE DEVICE MANAGEMENT METHOD
Document Type and Number:
WIPO Patent Application WO/2007/013467
Kind Code:
A1
Abstract:
It is possible to accurately and effectively analyze use conditions and failure causes of a plenty of management object devices. All-number diagnosis is periodically performed to inspect whether each of a plenty of management object devices T is normal or defective. Upon all-number diagnosis each time, diagnosis results Ic are recorded. If any device is found to be defective, the defective device is repaired or replaced. According to diagnosis results Ic of the all-number diagnosis performed several times, analysis data G, E are created to indicate a failure occurrence frequency N for each of the management object devices T.
Inventors:
FUJIWARA YOSHIYASU (JP)
ODA KAZUNORI (JP)
ODA KAZUNORI (JP)
Application Number:
PCT/JP2006/314691
Publication Date:
February 01, 2007
Filing Date:
July 25, 2006
Export Citation:
Assignee:
TLV CO LTD (JP)
FUJIWARA YOSHIYASU (JP)
ODA KAZUNORI (JP)
FUJIWARA YOSHIYASU (JP)
ODA KAZUNORI (JP)
International Classes:
G07C3/08; G01M99/00; F16T1/48
Foreign References:
| JP2002140745A | 2002-05-17 | |||
| JPS62246695A | 1987-10-27 | |||
| JP2003296475A | 2003-10-17 |
Other References:
See also references of EP 1914688A4
Attorney, Agent or Firm:
KITAMURA, Shuichiro (Nakanoshima 2-chome Kita-k, Osaka-shi Osaka 05, JP)
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