Title:
DEVICE FOR MEASURING COHERENCE OF SPIN-POLARIZED ELECTRON BEAM AND USAGE METHOD THEREOF
Document Type and Number:
WIPO Patent Application WO/2016/056425
Kind Code:
A1
Abstract:
In the present invention, the path of a spin-polarized electron beam is separated into two by a separator 6. The spinning direction of the electron beam is rotated by a spinning-direction rotating device 8 disposed on a first advancing path B1, and the electron beam is delayed by a first delaying device 10. On a second advancing path B2, the electron beam passes through a sample table. The portions of the spin-polarized electron beam separated into the first advancing path and the second advancing path are made to overlap each other by a biprism 16, and the intensity distribution of the spin-polarized electron beam is measured. The coherence is measured on the basis of the relationship among the spinning-direction rotation angle, the delay time, and the clarity of interference fringes.
Inventors:
KUWAHARA MAKOTO (JP)
TANAKA NOBUO (JP)
UJIHARA TORU (JP)
SAITOH KOH (JP)
TANAKA NOBUO (JP)
UJIHARA TORU (JP)
SAITOH KOH (JP)
Application Number:
PCT/JP2015/077393
Publication Date:
April 14, 2016
Filing Date:
September 28, 2015
Export Citation:
Assignee:
UNIV NAGOYA NAT UNIV CORP (JP)
International Classes:
G01N23/20; H01J37/26
Domestic Patent References:
| WO2011122171A1 | 2011-10-06 |
Foreign References:
| JP2008218063A | 2008-09-18 | |||
| JPH10106465A | 1998-04-24 |
Other References:
SOICHIRO KUSUNOKI ET AL.: "Spatial coherence of electron beam in spin-polarized transmission electron microscope", ABSTRACTS OF THE MEETING OF THE PHYSICAL SOCIETY OF JAPAN, vol. 68, no. 2, 26 August 2013 (2013-08-26)
MAKOTO KUWAHARA ET AL.: "Development of Spin- Polarized and Pulsed Transmission Electron Microscope -Based on the Fundamentals and the Advantage of Polarized Electron Source", MICROSCOPY, vol. 48, no. 1, 30 April 2013 (2013-04-30), pages 3 - 8, ISSN: 1349-0958
MAKOTO KUWAHARA ET AL.: "Development of Spin- Polarized and Pulsed Transmission Electron Microscope -Based on the Fundamentals and the Advantage of Polarized Electron Source", MICROSCOPY, vol. 48, no. 1, 30 April 2013 (2013-04-30), pages 3 - 8, ISSN: 1349-0958
Attorney, Agent or Firm:
KAI-U PATENT LAW FIRM (JP)
Patent business corporation KAI-U Patent Law Firm (JP)
Patent business corporation KAI-U Patent Law Firm (JP)
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