Title:
DEVICE FOR MEASURING HEAT TRANSFER RATE
Document Type and Number:
WIPO Patent Application WO/2018/186544
Kind Code:
A1
Abstract:
A device for measuring a heat transfer rate of the present invention includes: a first layer provided with a first and a second material portion disposed in parallel in a surface direction of an object; a second layer provided with a third material portion disposed in parallel with the first material portion in a thickness direction of the first layer and having the same thermal conductivity as the second material portion, and a fourth material portion disposed in parallel with the second material portion in the thickness direction and having the same thermal conductivity as the first material portion; and a temperature measurement layer between the first and the second layer, wherein the temperature measurement layer includes: a thermocouple portion provided with a first contact between the first and the third material portion, and a second contact between the second and the fourth material portion; and a noise detector.
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Inventors:
YI SUNGJAE (KR)
PARK HYUNSIK (KR)
RYU SUNGUK (KR)
YANG JINHWA (KR)
PARK HYUNSIK (KR)
RYU SUNGUK (KR)
YANG JINHWA (KR)
Application Number:
PCT/KR2017/011757
Publication Date:
October 11, 2018
Filing Date:
October 24, 2017
Export Citation:
Assignee:
KOREA ATOMIC ENERGY RES (KR)
International Classes:
G01K7/02; G01N25/18
Foreign References:
| KR20090079423A | 2009-07-22 | |||
| US4696578A | 1987-09-29 | |||
| KR20110064349A | 2011-06-15 | |||
| JP2007271456A | 2007-10-18 | |||
| JP2010025926A | 2010-02-04 |
Attorney, Agent or Firm:
PARK, Jang-Won (KR)
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