DEVICE FOR MEASURING MATERIAL PROPERTIES

WIPO Patent Application WO/2005/075965

A1

The invention relates to measuring engineering and can be used for measuring reflective properties of the flat surfaces of different materials, in particular a reflective factor and a standing-wave factor. The aim of said invention is to improve the accuracy of measurement and compensation for temperature fluctuations by recording and compensating a Pin-switch and a Gunn-generator. The inventive device for measuring material properties comprises a Gunn diode-based UHF generator, a three-port circulator, a Gunn diode-based UHF switch, an analog-to-digital converter, a measuring and controlling unit based on a microcontroller provided with a working and permanent storage device and an indicator. Said device also comprises an amplifier-inverter, four sample-and-hold devices, a first and a second voltage adders, a current resistance detector, a differential amplifier, a bias voltage supply and a multiplication/division operation evaluator.

ANANEV EVGENY NIKOLAEVICH (RU)
BUBLIK VIKTOR ALEXANDROVICH (RU)
VELIKANOV VIKTOR PAVLOVICH (RU)
SIDOROV IGOR ALEXANDROVICH (RU)

PCT/RU2004/000032

August 18, 2005

February 04, 2004

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ANANEV EVGENY NIKOLAEVICH (RU)
BUBLIK VIKTOR ALEXANDROVICH (RU)
VELIKANOV VIKTOR PAVLOVICH (RU)
SIDOROV IGOR ALEXANDROVICH (RU)

G01N22/00; G01R21/12; G01R21/14; G01R27/04; G01R27/06; (IPC1-7): G01N22/00; G01R21/12; G01R21/14; G01R27/04

RU2109272C1	1998-04-20
RU2132051C1	1999-06-20
US4500835A	1985-02-19
US4271389A	1981-06-02

Ananev, Evgeny Nikolaevich (4-10 Moscow, 7, RU)

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