Title:
DEVICE AND METHOD FOR INSPECTING SENSOR SYSTEM
Document Type and Number:
WIPO Patent Application WO/2020/017429
Kind Code:
A1
Abstract:
A sensor system (100) is provided with a light-emitting element for emitting a detection light (L1), a translucent cover (120) for allowing transmission of the detection light (L1), and a scanning mechanism for varying the emission direction of the detection light (L1) in at least one direction (D1). A light-receiving device (210) is provided with a plurality of inspection light-receiving elements (211a-211g) arranged along the first direction (D1). The light-receiving device (210) is disposed on the optical path of the detection light (L1) transmitted through the translucent cover (120). An inspection processor (220) outputs a determination result (R) indicating the presence/absence of an abnormality in the translucent cover (120) on the basis of whether each of the plurality of inspection light-receiving elements (211a-211g) receives the detection light (L1) normally.
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Inventors:
WATANABE SHIGEYUKI (JP)
WATANO YUICHI (JP)
OKAMURA SHUNSUKE (JP)
WATANO YUICHI (JP)
OKAMURA SHUNSUKE (JP)
Application Number:
PCT/JP2019/027545
Publication Date:
January 23, 2020
Filing Date:
July 11, 2019
Export Citation:
Assignee:
KOITO MFG CO LTD (JP)
International Classes:
G01N21/958; G01M11/00; G01S7/497
Foreign References:
| US20050006573A1 | 2005-01-13 | |||
| JPH10142335A | 1998-05-29 | |||
| JP2008164477A | 2008-07-17 | |||
| JP2007214179A | 2007-08-23 | |||
| JPH0961293A | 1997-03-07 | |||
| JP2008026076A | 2008-02-07 | |||
| US20130235379A1 | 2013-09-12 |
Attorney, Agent or Firm:
SHIN-EI PATENT FIRM, P.C. (JP)
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