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Patent Searching and Data


Title:
DEVICE AND METHOD FOR MEASURING VOLTAGE BY USING OPTICAL ELEMENT
Document Type and Number:
WIPO Patent Application WO/2022/114402
Kind Code:
A1
Abstract:
According to the present disclosure, a device for measuring a voltage by using a Pockels cell comprises: a Pockels cell for changing a reflective index of incident light on the basis of an applied electric field; at least one non-polarizing beam splitter for splitting an incident beam; a first polarizing plate for polarizing a first beam split by the at least one non-polarizing beam splitter; a first light detector for detecting light polarized based on the first polarizing plate; a 1/4 wave plate which elliptically polarizes a second beam split by the at least one non-polarizing beam splitter and outputs same; a second polarizing plate for polarizing the elliptically polarized second beam; a second light detector for detecting light polarized based on the 1/4 wave plate and the second polarizing plate; and a controller for measuring a voltage on the basis of a first light intensity determined by the first light detector and a second light intensity determined by the second light detector.

Inventors:
HONG SUNGHOON (KR)
WOO HYUN JONG (KR)
GHIM YOUNGCHUL (KR)
CHOI SEONGMIN (KR)
LEE DONGGEUN (KR)
SUGIANTO ALVIN AMRY (KR)
Application Number:
PCT/KR2021/003346
Publication Date:
June 02, 2022
Filing Date:
March 18, 2021
Export Citation:
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Assignee:
AGENCY DEFENSE DEV (KR)
KOREA ADVANCED INST SCI & TECH (KR)
International Classes:
G01R15/24; G01R15/22; G01R19/00; G01R31/305; H01S3/10; H01S3/107
Foreign References:
KR20170141148A2017-12-22
KR100201022B11999-06-15
KR20060005199A2006-01-17
JPH1066247A1998-03-06
Other References:
S. CHOI, A.A. SUGIANTO, D.-G. LEE, H.J. WOO, S.H. HONGC, Y.-C. GHIMA: "Polar-coordinate-based data analysis scheme for highvoltage measurement system using the Pockels electrooptic effect. ", JOURNAL OF INSTRUMENTATION (JINST)., vol. 15, 18 March 2020 (2020-03-18), pages 1 - 11, XP055933588
Attorney, Agent or Firm:
Y.P.LEE, MOCK & PARTNERS (KR)
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