Title:
DEVICE, METHOD, AND PROGRAM FOR DETECTING SIGNS OF ABNORMALITY IN PRODUCTION LINE, PRODUCTION DEVICE, AND INSPECTION DEVICE
Document Type and Number:
WIPO Patent Application WO/2022/224657
Kind Code:
A1
Abstract:
Provided are: a device, a method, and a program for detecting signs of an abnormality in a production line which make it possible to detect signs of an abnormality in a production line; a production device; and an inspection device. A processor in the device (30) for detecting signs of an abnormality in a production line acquires images captured by a radiography device (20) of each product (P) produced by a production line (10), and acquires singularity information relating to the singularities of the products (P) on the basis of the acquired images. The processor stores information affecting the determination of whether a defect is present in the products (P) within the singularity information as information relating to defects in memory, and designates information not affecting the determination of whether a defect is present in the products as information not relating to defects in the memory. The processor calculates a line evaluation value indicating the soundness of the production line (10) on the basis of the information relating to defects and the information not relating to defects, and detects signs of an abnormality in the production line (10) on the basis of the calculated line evaluation value.
Inventors:
IKEDA HARUKA (JP)
Application Number:
PCT/JP2022/012546
Publication Date:
October 27, 2022
Filing Date:
March 18, 2022
Export Citation:
Assignee:
FUJIFILM CORP (JP)
International Classes:
G05B23/02; G05B19/418; G06T7/00
Foreign References:
| JP2020027425A | 2020-02-20 | |||
| JP2008294361A | 2008-12-04 | |||
| JP2012242982A | 2012-12-10 | |||
| JP2020061109A | 2020-04-16 | |||
| JP2008015930A | 2008-01-24 |
Attorney, Agent or Firm:
MATSUURA, Kenzo (JP)
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