Title:
DEVICE, METHOD, AND PROGRAM FOR SPECIFYING ABNORMALITY-OCCURRENCE AREA OF SECONDARY BATTERY SYSTEM
Document Type and Number:
WIPO Patent Application WO/2015/029831
Kind Code:
A1
Abstract:
The present invention pertains to a device, method, and program for specifying an abnormality-occurrence area of a secondary battery system. The device has: an information acquisition unit (54) for acquiring information about a module (module information) from among a plurality of modules included in a module series that accommodates a block for which the difference between a block voltage value and a block voltage value after a primary delay has changed so as to exceed a voltage threshold within a preset time before and after the point in time at which the block voltage value and series current value stopped being correlated; a notification reception unit (56) for receiving a notification about the occurrence of an abnormality in a secondary battery; and a module specification unit (58) for specifying at least the module corresponding to the latest module information as the module in which an abnormality occurred when the notification reception unit (56) receives a notification.
Inventors:
FUKUHARA MOTOHIRO (JP)
Application Number:
PCT/JP2014/071600
Publication Date:
March 05, 2015
Filing Date:
August 19, 2014
Export Citation:
Assignee:
NGK INSULATORS LTD (JP)
International Classes:
G01R31/36; H02J7/00
Domestic Patent References:
| WO2011148592A1 | 2011-12-01 |
Foreign References:
| JP2012088097A | 2012-05-10 | |||
| JPH03158781A | 1991-07-08 |
Other References:
See also references of EP 3040733A4
Attorney, Agent or Firm:
CHIBA Yoshihiro et al. (JP)
Takehiro Chiba (JP)
Takehiro Chiba (JP)
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