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Patent Searching and Data


Title:
DEVICE STATE DIAGNOSTIC SYSTEM
Document Type and Number:
WIPO Patent Application WO/2012/025968
Kind Code:
A1
Abstract:
The present invention is preferable for the case where a device must be diagnosed in a certain period of time, and provides a device state diagnostic system that uses a past state of the device to narrow down a rule to be used for the diagnosis, thereby reducing time necessary for the diagnosis. The present invention is a system that reduces a process time necessary for a state diagnosis of a device as much as possible even in the case where vast amounts of rules to be used for the diagnosis exist. Specifically, the present invention is a system that calculates a state transition probability of the device by using state transition information relating to the device when diagnosing the state of the device on the basis of sensor data or data obtained by processing the sensor data, and provides a rule to be used to diagnose a current state of the device and the state transition probability for a user.

Inventors:
UCHIYAMA HIROKI (JP)
SUZUKI HIDEAKI (JP)
NAKAMURA KOZO (JP)
MINEMURA KESAAKI (JP)
Application Number:
PCT/JP2010/005284
Publication Date:
March 01, 2012
Filing Date:
August 27, 2010
Export Citation:
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Assignee:
HITACHI LTD (JP)
UCHIYAMA HIROKI (JP)
SUZUKI HIDEAKI (JP)
NAKAMURA KOZO (JP)
MINEMURA KESAAKI (JP)
International Classes:
G05B23/02
Foreign References:
JP2004034112A2004-02-05
JP2008001233A2008-01-10
JPH05108354A1993-04-30
JP2004297234A2004-10-21
Attorney, Agent or Firm:
INOUE, Manabu et al. (JP)
Manabu Inoue (JP)
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Claims: