DEVICE, SYSTEM AND METHOD FOR CALCULATING FAILURE RATE

WIPO Patent Application WO/2011/033651

A1

Disclosed are a device, system and method for calculating failure rate with high precision even if the number of operating units or the number of failed units is low. The device and system are provided with a first read-out unit (102) for reading out first identification information corresponding to a first product type from a failure DB (1); a second read-out unit (103) for reading out failure monitoring information corresponding to the first identification information and non-failure monitoring information representing monitoring information other than the failure monitoring information of the first product type from the monitoring DB (2); a creation unit (104) for creating a failure model capable of calculating the failure probability for monitoring information that has been input from the failure monitoring information and the non-failure monitoring information; a first calculation unit (105) for inputting monitoring information corresponding to a second product type into the failure model and calculating the failure probability of a product of the second product type; and a second calculation unit (106) for calculating the failure rate of products of the second product type on the basis of the calculated failure probability.

SHINGAKI RYUSEI (JP)
NISHIKAWA TAKEICHIRO (JP)
NAKATSUGAWA MINORU (JP)

PCT/JP2009/066373

March 24, 2011

September 18, 2009

Click for automatic bibliography generation  

TOSHIBA KK (JP)
SHINGAKI RYUSEI (JP)
NISHIKAWA TAKEICHIRO (JP)
NAKATSUGAWA MINORU (JP)

G06F11/30; G05B23/02; G06F11/34

JP2003331087A	2003-11-21
JP2007328522A	2007-12-20
JP2009211472A	2009-09-17

SAKAI, Hiroaki et al. (JP)
Hiroaki Sakai (JP)

View/Download PDF      PDF Help

Previous Patent: PATH SEARCHING METHOD AND NODE APPARATUS

Next Patent: AIR CONDITIONING DEVICE