Title:
EXAMINATION/DIAGNOSIS DEVICE
Document Type and Number:
WIPO Patent Application WO/2016/174819
Kind Code:
A1
Abstract:
The examination/diagnosis device according to the present invention includes a probe, a stress detecting part, and a grip part. The probe has a tall part and a distal-end part, and the distal-end part is provided so as to curve from one end part of the tall part. The stress detecting part is configured so as to be capable of detecting an X-direction force, a Y-direction force, and a Z-direction force applied to the distal-end part of the probe. The distal-end part of the probe may be bent in a plane parallel to the X direction and the Z direction. A user brings the distal-end part of the probe into contact with a joint as a subject of examination and diagnosis while gripping the grip part.
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Inventors:
HANANOUCHI TAKEHITO (JP)
Application Number:
PCT/JP2016/001819
Publication Date:
November 03, 2016
Filing Date:
March 29, 2016
Export Citation:
Assignee:
OSAKA SANGYO UNIV (JP)
International Classes:
A61B10/00; A61B1/00
Foreign References:
| JP2000517051A | 2000-12-19 | |||
| JPH09510644A | 1997-10-28 |
Attorney, Agent or Firm:
FUKUSHIMA, Yoshito (JP)
Yoshihito Fukushima (JP)
Yoshihito Fukushima (JP)
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