Title:
DEVICES UNDER TEST
Document Type and Number:
WIPO Patent Application WO/2016/040356
Kind Code:
A3
Abstract:
In described examples, a system (100) can include device under test (DUT) cells (114). Each DUT cell (114) can include a DUT (116) and switches configured to control a flow of current to the DUT (116). The system (100) can further include a controller (108) configured to execute tests on the DUTs (116). Each of the tests includes applying a measurement condition to a given DUT (116) and concurrently applying a stress condition to the remaining DUTs (116). The tests can provide measurements sufficient to determine a bias thermal instability and a time dependent dielectric breakdown of the given DUT (116).
Inventors:
CHEN MIN (US)
REDDY VIJAY KUMAR (US)
REDDY VIJAY KUMAR (US)
Application Number:
PCT/US2015/048996
Publication Date:
May 06, 2016
Filing Date:
September 08, 2015
Export Citation:
Assignee:
TEXAS INSTRUMENTS INC (US)
TEXAS INSTRUMENTS JAPAN (JP)
TEXAS INSTRUMENTS JAPAN (JP)
International Classes:
G01R31/26
Foreign References:
| US8692571B2 | 2014-04-08 | |||
| US7103861B2 | 2006-09-05 | |||
| US7456628B2 | 2008-11-25 | |||
| US7724017B2 | 2010-05-25 |
Attorney, Agent or Firm:
DAVIS, Michael A , Jr. et al. (International Patent ManagerP.O Box 655474, Mail Station 399, Dallas TX, US)
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