Title:
DIAGNOSIS DEVICE AND DIAGNOSIS METHOD
Document Type and Number:
WIPO Patent Application WO/2019/167375
Kind Code:
A1
Abstract:
The present invention provides a diagnosis device for diagnosing an abnormality in a facility on the basis of operation data of the facility, the diagnosis device being provided with: a clustering unit for determining whether the operation data of the facility can be classified into existing clusters or not, and in the case where it is determined that the classification cannot be performed, adding a cluster, an attribute of which is set to be abnormal to the existing clusters; a diagnosis unit for diagnosing an abnormality in the facility on the basis of a result of the processing by the clustering unit; and a cluster attribute setting unit for setting attributes of the existing clusters on the basis of the operation data of the facility in a predetermined period.
Inventors:
SEKIAI TAKAAKI (JP)
TANNO MITSUHIRO (JP)
KUROHA YOSHIYUKI (JP)
TANNO MITSUHIRO (JP)
KUROHA YOSHIYUKI (JP)
Application Number:
PCT/JP2018/044793
Publication Date:
September 06, 2019
Filing Date:
December 05, 2018
Export Citation:
Assignee:
HITACHI LTD (JP)
International Classes:
G05B23/02
Domestic Patent References:
| WO2017022784A1 | 2017-02-09 |
Foreign References:
| JP2015162140A | 2015-09-07 | |||
| US20070088550A1 | 2007-04-19 | |||
| JP2016033778A | 2016-03-10 | |||
| JP2015018389A | 2015-01-29 | |||
| JP2010237893A | 2010-10-21 | |||
| JP2010237893A | 2010-10-21 | |||
| JP2015018389A | 2015-01-29 |
Other References:
See also references of EP 3761133A4
Attorney, Agent or Firm:
SUNNEXT INTERNATIONAL PATENT OFFICE (JP)
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