DIAGNOSIS DEVICE, DIAGNOSIS SYSTEM, DIAGNOSIS METHOD, AND PROGRAM

Title:

DIAGNOSIS DEVICE, DIAGNOSIS SYSTEM, DIAGNOSIS METHOD, AND PROGRAM

Document Type and Number:

WIPO Patent Application WO/2018/169069

Kind Code:

A1

Abstract:

A device includes: a first acquiring unit to acquire context information corresponding to running operation among pieces of context information; a second acquiring unit to acquire detection information output from a detecting unit detecting a physical quantity of a target device; an extracting unit to extract, from the detection information, feature information indicating a feature of the detection information in an interval including a specific operation interval of the target device; a selecting unit to select reference feature information used as reference based on the feature information, and sequentially select pieces of target feature information; a calculating unit to calculate a likelihood of a process interval based on a comparison between the reference feature information and each piece of target feature information; a determining unit to determine whether the target feature information corresponding to the likelihood is included in the process interval based on the likelihood; and an estimating unit to estimate the process interval based on a determination result.

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Inventors:

GOTO SATORU (JP)
TAKAMI JUNICHI (JP)
SHIRATA YASUNOBU (JP)
UMEZAWA TOMOKI (JP)
MURAMOTO YOHSUKE (JP)
HORIO TAKAFUMI (JP)
TESHIMA YU (JP)

Application Number:

PCT/JP2018/010567

Publication Date:

September 20, 2018

Filing Date:

March 16, 2018

Export Citation:

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Assignee:

RICOH CO LTD (JP)
GOTO SATORU (JP)
TAKAMI JUNICHI (JP)
SHIRATA YASUNOBU (JP)
UMEZAWA TOMOKI (JP)
MURAMOTO YOHSUKE (JP)
HORIO TAKAFUMI (JP)
TESHIMA YU (JP)

International Classes:

G05B19/4065; G05B23/02

Domestic Patent References:

WO2018030422A2

2018-02-15

Foreign References:

US20120078670A1	2012-03-29
JP4860444B2	2012-01-25

Attorney, Agent or Firm:

SAKAI, Hiroaki (JP)

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