DIAGNOSTIC DEVICE, DIAGNOSTIC METHOD, AND DIAGNOSTIC PROGRAM

Title:

DIAGNOSTIC DEVICE, DIAGNOSTIC METHOD, AND DIAGNOSTIC PROGRAM

Document Type and Number:

WIPO Patent Application WO/2018/042616

Kind Code:

A1

Abstract:

The diagnostic device (1) of the present invention is provided with: an operation condition determination unit (21), which, at a reference point in time at which it is already known whether a device is normal or abnormal, determines which of multiple operating states is the operating state of the device at that point in time; a reference data creation unit (22) which, at a reference point in time, repeats a process in which sensor values acquired from the device while varying the operating state are associated with the respective determined operating states to store the association in a storage unit, the process thereof being repeated until there are no more unsupported operating states for which acquired sensor values are not yet associated; a diagnostic data creation unit (23) which, at a diagnostic point in time at which it is not already known whether a device is normal or abnormal, acquires the sensor value and operating state of the device at that point in time; and a diagnostic unit (24) which reads, from the storage unit, the acquired sensor value associated with the operating state, and compares the sensor value acquired at the diagnostic point in time with the sensor value that was read so as to determine whether the device is normal or abnormal, and displays the result thereof.

Inventors:

UNUMA MUNETOSHI (JP)
FUJIWARA JUNSUKE (JP)

Application Number:

PCT/JP2016/075782

Publication Date:

March 08, 2018

Filing Date:

September 02, 2016

Export Citation:

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Assignee:

HITACHI LTD (JP)

International Classes:

G01M99/00; G05B23/02

Domestic Patent References:

WO2011024382A1

2011-03-03

Foreign References:

JP2002182736A	2002-06-26
JP2005241089A	2005-09-08
JP2011174766A	2011-09-08

Other References: