DIAGNOSTIC MICROPARTICLE PROBE COMPRISING MAGNETIC PARTICLE AND INACTIVATED GENETIC SCISSORS, AND MULTI-DIAGNOSTIC SYSTEM AND METHOD INVOLVING PROBE

Title:

DIAGNOSTIC MICROPARTICLE PROBE COMPRISING MAGNETIC PARTICLE AND INACTIVATED GENETIC SCISSORS, AND MULTI-DIAGNOSTIC SYSTEM AND METHOD INVOLVING PROBE

Document Type and Number:

WIPO Patent Application WO/2023/244069

Kind Code:

A1

Abstract:

The present invention relates to a diagnostic microparticle probe comprising a magnetic particle and inactivated genetic scissors, and a multi-diagnostic system and method involving the probe, which not only enables faster and more accurate diagnosis than conventional diagnostic methods but also can be used for multiple diagnoses by introducing genetic scissors technology into a diagnostic microparticle probe.

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Inventors:

JUNG YONG-GYUN (KR)
CHOI YOUNG WOOK (KR)
CHOI HEELAK (KR)

Application Number:

PCT/KR2023/008357

Publication Date:

December 21, 2023

Filing Date:

June 16, 2023

Export Citation:

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Assignee:

EZDIATECH INC (KR)

International Classes:

C12Q1/6876; C12N9/22; C12N15/113; C12Q1/70

Domestic Patent References:

WO2020102610A1

2020-05-22

Foreign References:

KR20220059418A	2022-05-10
KR20220017381A	2022-02-11
KR20200043915A	2020-04-28
KR20200103638A	2020-09-02

Attorney, Agent or Firm:

KWAK, Hyun Kyu (KR)

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