Title:
DIAPHRAGM POSITION MEASURING METHOD, DIAPHRAGM POSITION MEASURING DEVICE, DIAPHRAGM POSITIONING METHOD AND DIAPHRAGM POSITIONING DEVICE
Document Type and Number:
WIPO Patent Application WO/2012/011406
Kind Code:
A1
Abstract:
Disclosed are a diaphragm position measuring method and a diaphragm position measuring device which are capable of accurately measuring the amount of offset between the center of an optical diaphragm and the optical axis. Also disclosed are a diaphragm positioning method and a diaphragm positioning device which are capable of accurately disposing an optical diaphragm in a lens unit. If a light collection spot is formed by causing parallel light to be incident on a lens of a lens unit supported by a glass plate and the position of the light collection spot is detected by a microscope, the position of the light collection spot can be used as a reference point for positioning an optical diaphragm. The amount of offset between the position of the light collection spot and the position of the center of the optical diaphragm obtained by the microscope can be found by a central processing unit, and using the result thereof, the lens unit can be effectively inspected. Consequently, the amount of offset of the position of the center of the optical diaphragm can be detected with an error of ±3 μm or less.
Inventors:
WADA Kazuhiro (Inc. 2970, Ishikawa-machi, Hachioji-sh, Tokyo 05, 〒1928505, JP)
Application Number:
JP2011/065835
Publication Date:
January 26, 2012
Filing Date:
July 12, 2011
Export Citation:
Assignee:
Konica Minolta Opto, Inc. (2970, Ishikawa-machi Hachioji-sh, Tokyo 05, 〒1928505, JP)
コニカミノルタオプト株式会社 (〒05 東京都八王子市石川町２９７０番地 Tokyo, 〒1928505, JP)
コニカミノルタオプト株式会社 (〒05 東京都八王子市石川町２９７０番地 Tokyo, 〒1928505, JP)
International Classes:
G01M11/00; G01B11/00
Attorney, Agent or Firm:
TAMURA Keijiro et al. (8th Floor, Masumoto Bldg. 4-3, Nishi-Shinjuku 7-chome, Shinjuku-k, Tokyo 23, 〒1600023, JP)
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Claims: