Title:
DIELECTRIC CONSTANT MEASUREMENT METHOD, DIELECTRIC CONSTANT MEASUREMENT SYSTEM, AND DIELECTRIC CONSTANT MEASUREMENT PROGRAM
Document Type and Number:
WIPO Patent Application WO/2023/157188
Kind Code:
A1
Abstract:
This dielectric constant measurement method comprises: a step for obtaining an admittance of a calibration standard (P1) having a known dielectric constant; a step for measuring a first reflection coefficient; a step for calculating an open-state reflection coefficient of a dielectric spectral sensor (1) in an ideal open state on the basis of the first reflection coefficient and the admittance of the calibration standard (P1) obtained when the calibration standard (P1) is placed on a measurement end surface; a step for calculating a reflection coefficient of a calibration standard other than the first calibration standard on the basis of the open-state reflection coefficient and an admittance of the calibration standard other than the first calibration standard; a step for measuring a reflection coefficient of an object of interest; and a step for calculating a dielectric constant of the object of interest on the basis of the first reflection coefficient, the reflection coefficient of the calibration standard other than the first calibration standard, the reflection coefficient of the object of interest, the admittance of the first calibration standard, and the admittance of the calibration standard other than the first calibration standard.
Inventors:
NAKAMURA MASAHITO (JP)
TAJIMA TAKURO (JP)
SEYAMA MICHIKO (JP)
IKEDA AYUMI (JP)
TAJIMA TAKURO (JP)
SEYAMA MICHIKO (JP)
IKEDA AYUMI (JP)
Application Number:
PCT/JP2022/006425
Publication Date:
August 24, 2023
Filing Date:
February 17, 2022
Export Citation:
Assignee:
NIPPON TELEGRAPH & TELEPHONE (JP)
International Classes:
G01N22/00
Domestic Patent References:
| WO2021205503A1 | 2021-10-14 |
Foreign References:
| US4246534A | 1981-01-20 | |||
| US6472885B1 | 2002-10-29 |
Attorney, Agent or Firm:
MIYOSHI Hidekazu et al. (JP)
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