Title:
DIFFRACTED LIGHT REMOVAL SLIT AND OPTICAL SAMPLE DETECTION SYSTEM USING SAME
Document Type and Number:
WIPO Patent Application WO/2019/077932
Kind Code:
A1
Abstract:
[Problem] To provide, in a sample detection device using reflected excitation light, a diffracted light removal slit that is capable of reliably removing diffracted light from the excitation light without influencing the reflected excitation light and to provide an optical sample detection device comprising this diffracted light removal slit. [Solution] A diffracted light removal slit provided between a light source unit and an excitation light reflection body in an optical sample detection system in which excitation light is irradiated from the light source unit and prescribed measurement is carried out using excitation light that has been reflected by the excitation light reflection body, said diffracted light removal slit comprising a main part provided in a direction roughly perpendicular to the optical path of the excitation light and a side wall part that extends from the edge of the main part and is inclined toward the upstream side in the direction of the optical path of the excitation light.
Inventors:
NAKAMURA YUKITO (JP)
KAYA TAKATOSHI (JP)
KAYA TAKATOSHI (JP)
Application Number:
PCT/JP2018/034784
Publication Date:
April 25, 2019
Filing Date:
September 20, 2018
Export Citation:
Assignee:
KONICA MINOLTA INC (JP)
International Classes:
G01N21/64
Domestic Patent References:
| WO2015064704A1 | 2015-05-07 |
Foreign References:
| JPH0432728A | 1992-02-04 | |||
| JPS57153250A | 1982-09-21 | |||
| JP2000356586A | 2000-12-26 | |||
| JPH09133803A | 1997-05-20 | |||
| JP2006242902A | 2006-09-14 |
Other References:
See also references of EP 3683571A4
Attorney, Agent or Firm:
SSINPAT PATENT FIRM (JP)
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