DIMENSION MEASUREMENT DEVICE, DIMENSION MEASUREMENT SYSTEM, AND DIMENSION MEASUREMENT METHOD

WIPO Patent Application WO/2017/013873

A1

Provided are a reference scale and dimension measurement system that make it possible to maintain accurate measurement even if the reference scale is not disposed or projected on a measurement surface. A dimension measurement device according to the present invention is provided with: a reference scale extraction means for extracting, from photographed image data including a reference scale that includes a film that has a pattern for displaying a length reference formed on the surface thereof and a lens that is in contact with the film, an image in which an image of the length reference is formed on the basis of the relationship between a pattern function expressing the length reference projected onto the lens according to variation in a prescribed angle between the reference scale and the optical axis of a photography device and an image formation color function indicating the image of the length reference formed on the imaging device; an object of measurement extraction means for extracting an object of measurement image from photographed image data including the reference scale; and a dimension calculation means for calculating a dimension of the object of measurement on the basis of a dimension of the image in which the image of the length reference is formed and the image of the object of measurement.

FUKUSHI KENICHIRO (JP)
KUSUMOTO MANABU (JP)
KAMEDA YOSHIO (JP)
ISHIDA HISASHI (JP)
HSU CHENPIN (JP)
NOZAKI TAKEO (JP)

PCT/JP2016/003389

January 26, 2017

July 19, 2016

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NEC CORP (JP)

G01B11/02

JP2013113809A	2013-06-10
JP2006267879A	2006-10-05
JPH0659341A	1994-03-04

SHIMOSAKA, Naoki (JP)

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