DISASTER-AFFECTED AREA ESTIMATION DEVICE AND PROGRAM

WIPO Patent Application WO/2011/030662

A1

Using information which can be collected on site, estimation of the area of damage at that time, and further, prediction regarding the expansion of the area affected by the disaster thereafter, can be performed. A disaster-affected area estimation device (10) for estimating a area affected by a disaster at the time that the disaster occurs, is provided with a storage unit (21) which stores an exposure calculation formula representing an exposure amount using a diffusion degree and a flow rate of a material, the exposure amount being an integration value of a concentration of a material with respect to time, at a certain time at a certain location; an information acquisition unit (22) for acquiring location information of each person affected by the disaster at a certain time as input information; and a calculation unit (23) for obtaining a critical value of the exposure amount by applying the location information of each person affected by the disaster at said certain time to the exposure calculation formula, and specifying the area affected by the disaster at said certain time on the basis of the exposure calculation formula when the critical value is obtained.

NUKATSUKA SHIGEHIRO (JP)
SATO AKIYOSHI (JP)
ADACHI TAKESHI (JP)
NARIKI KOTARO (JP)

PCT/JP2010/064232

March 17, 2011

August 24, 2010

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MITSUBISHI HEAVY IND LTD (JP)
NUKATSUKA SHIGEHIRO (JP)
SATO AKIYOSHI (JP)
ADACHI TAKESHI (JP)
NARIKI KOTARO (JP)

G08B31/00; G01W1/00; G06Q10/04

JP2003307573A	2003-10-31
JP2001042052A	2001-02-16
JPH11326521A	1999-11-26
JP2003307573A	2003-10-31

FUJITA, Takaharu et al. (JP)
Takaharu Fujita (JP)

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