DISCRIMINATION OF LOW-ATOMIC WEIGHT MATERIALS USING SCATTERING AND STOPPING OF COSMIC-RAY ELECTRONS AND MUONS

WIPO Patent Application WO/2015/178986

A3

Techniques, systems, and devices are disclosed for constructing a scattering and stopping relationship of cosmic-ray charged particles (including cosmic-ray electrons and/or cosmic-ray muons) over a range of low-atomic-mass materials, and to detect and identify content of a volume of interest (VOI) exposed to cosmic-ray charged particles based on the constructed scattering and stopping relationship. In one aspect, a process for constructing a scattering- stopping relationship for a range of low-density materials exposed to cosmic-ray charged particles is disclosed. This technique first determines a scattering parameter and a stopping parameter for each material within the range of low-density materials exposed to charged particles from cosmic ray. The technique then establishes a scattering-stopping relationship of cosmic ray charged particles for the range of low-density materials based on the determined pairs of scattering and stopping parameters associated with the range of low-density materials.

BLANPIED GARY (US)
KUMAR SANKARAN (US)
DORROH DUSTIN (US)
MORGAN CRAIG (US)
SOSSONG MICHAEL JAMES (US)

PCT/US2015/017846

January 28, 2016

February 26, 2015

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DECISION SCIENCES INT CORP (US)

G01T1/00; G01T1/16

US8536527B2	2013-09-17
US7945105B1	2011-05-17
US8575546B2	2013-11-05

MORRIS ET AL.: "Obtaining material identification with cosmic ray radiography.", ARXIV:1210.6102 [PHYSICS.INS-DET, 23 October 2012 (2012-10-23), XP012165705, Retrieved from the Internet

LEE, Hwa, C. (P.O. Box 1247Seattle, WA, US)

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