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Patent Searching and Data


Title:
DISTANCE MEASUREMENT APPARATUS, DISTANCE MEASUREMENT METHOD, AND DISTANCE MEASUREMENT PROGRAM
Document Type and Number:
WIPO Patent Application WO/2018/079030
Kind Code:
A1
Abstract:
This distance measurement apparatus (1) is provided with: a projection unit (13) that projects a plurality of pattern lights having bright regions and dark regions onto a subject in succession; an imaging unit (12) that captures an image of the subject, thereby acquiring a plurality of captured images that correspond to the plurality of pattern lights; a triangulation unit (22) that measures the distance to the subject at a pixel of interest by triangulation from the plurality of captured images; and a measurement error occurrence location determination unit (21) that determines, on the basis of the result of comparing pixel values of the pixel of interest in the plurality of captured images, whether the pixel of interest is in a location at which there is a high possibility that distance measurement error will occur. The plurality of pattern lights include a plurality of first pattern lights and a plurality of second pattern lights. The result of comparison arises from a comparison of the maximum value among the pixel values of the pixel of interest in the plurality of captured images acquired when the plurality of first pattern lights are projected in succession and the maximum value among the pixel values of the pixel of interest in the plurality of captured images acquired when the plurality of second pattern lights are projected in succession.

Inventors:
FUJITA TAKEO (JP)
SUZUKI DAISUKE (JP)
Application Number:
PCT/JP2017/030090
Publication Date:
May 03, 2018
Filing Date:
August 23, 2017
Export Citation:
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Assignee:
MITSUBISHI ELECTRIC CORP (JP)
International Classes:
G01C3/06
Foreign References:
JP2015078935A2015-04-23
JP2014115108A2014-06-26
JP2009047498A2009-03-05
JP2003279332A2003-10-02
Attorney, Agent or Firm:
MAEDA Minoru et al. (JP)
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