DISTANCE MEASUREMENT DEVICE

WIPO Patent Application WO/2020/090911

A1

[Problem] To provide a distance measurement device that can detect a reflection signal from an object with high sensitivity. [Solution] A distance measurement device 100 includes a light irradiation unit 10, a light reception unit 12, and a signal processing unit 14. The signal processing unit 14 acquires an intensity waveform which includes the reflected light of pulse light on the basis of the temporal change of an intensity signal outputted as reception intensity from the light reception unit 12, and calculates the distance from the measurement device to an object on the basis of the intensity waveform. The light irradiation unit 10 outputs first pulse light, and second pulse light having at least one of a waveform and an output timing changed with respect to the first pulse light. The signal processing unit 14 calculates a correction signal from which a noise signal caused by an external disturbance has been removed by carrying out prescribed signal processing with respect to a first intensity waveform including the first reflected light of the first pulse light and a second intensity waveform including the second reflected light of second pulse light. The signal processing unit 14 calculates the distance from the measurement device to an object 200 to be measured on the basis of the waveform of a correction signal.

KIMURA TEIYU (JP)
OZAKI NORIYUKI (JP)
AZUMA KENTA (JP)
HATA TAKEHIRO (JP)
MATSUBARA HIROYUKI (JP)
TAKAI ISAMU (JP)
SOGA MINEKI (JP)

PCT/JP2019/042624

May 07, 2020

October 30, 2019

Click for automatic bibliography generation  

DENSO CORP (JP)

G01S7/484; G01C3/06; G01S7/497

JPH07234282A	1995-09-05
JP2000266537A	2000-09-29
JPH03188322A	1991-08-16
JPS62288512A	1987-12-15
JP2000137076A	2000-05-16
JP2017173207A	2017-09-28

TOHDA, Kiyoshi (JP)

View/Download PDF      PDF Help

Previous Patent: LIGHTED PUSH BUTTON SWITCH

Next Patent: LASER MACHINING HEAD AND LASER MACHINING DEVICE