DISTORTION MEASUREMENT SYSTEM FOR TRANSPARENT FILM

Title:

DISTORTION MEASUREMENT SYSTEM FOR TRANSPARENT FILM

Document Type and Number:

WIPO Patent Application WO/2015/045434

Kind Code:

A1

Abstract:

A distortion measurement system provided with a plurality of light sources (1-1-1-n), a plurality of types of polarizing filters (2-1-2-n) alternatingly positioned in relation to the plurality of light sources (1-1-1-n), an image sensor (3) for capturing light which has passed through the polarizing filters (2-1-2-n) and a transparent film (200), an analysis device (4) for analyzing the distortion of the transparent film (200) on the basis of the transmitted optical image captured by the image sensor (3), and a light-emission control unit (5) for causing the plurality of light sources (1-1-1-n) to blink by sequentially switching between light sources on which the plurality of different types of polarizing filters are arranged, wherein sequentially switching between blinking light sources (1-1-1-n) makes it possible to quickly switch the angle of polarization in comparison to when rotating a polarizing plate, and to quickly measure the optical axis direction and the phase difference of transmitted light produced by a distortion section by using one general-purpose image sensor (3).

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Inventors:

TANAKA KENJI (JP)

Application Number:

PCT/JP2014/052431

Publication Date:

April 02, 2015

Filing Date:

February 03, 2014

Export Citation:

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Assignee:

TANAKA KENJI (JP)

International Classes:

G01N21/89; G01N21/21; G01N21/892; G01N21/896; G02B5/30

Foreign References:

JP2003035613A	2003-02-07
JPH04329339A	1992-11-18
JP2012234081A	2012-11-29
JP2007263593A	2007-10-11
JP2009276088A	2009-11-26
JPH06180282A	1994-06-28
JP2013068500A	2013-04-18