DNA CHIP IMAGE SPOT VALIDITY ASSESSING DEVICE, DNA CHIP IMAGE SPOT VALIDITY ASSESSING METHOD, AND DNA CHIP IMAGE SPOT VALIDITY ASSESSING PROGRAM

Title:

DNA CHIP IMAGE SPOT VALIDITY ASSESSING DEVICE, DNA CHIP IMAGE SPOT VALIDITY ASSESSING METHOD, AND DNA CHIP IMAGE SPOT VALIDITY ASSESSING PROGRAM

Document Type and Number:

WIPO Patent Application WO/2016/152159

Kind Code:

A1

Abstract:

The invention makes it possible to prevent erroneous detection based on contamination or based on a pseudo-spot in a DNA chip image, and to improve the accuracy of examinations employing DNA chips. A device for assessing the validity of spots in a DNA chip image obtained by capturing an image of the DNA chip, to which probes have been fixed, in a state in which a labeled specimen has been bound to the probes, the device being provided with: a multi-stage binarization processing unit which creates a plurality of binarized images from the DNA chip image using, as thresholds to be used in an image binarization process, a plurality of thresholds distributed over the entire range of brightness in the DNA chip image; a spot shape and position detecting unit which detects the shapes and positions of spots in the binarized images; and a spot shape and position assessing unit which assesses the acceptability of the spot shapes and positions detected by the spot shape and position detecting unit.

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Inventors:

KASHIWABARA KEN (JP)
OONUKI RYUUJI (JP)
ISSHIKI ATSUNORI (JP)
NAKAJIMA KAZUKI (JP)

Application Number:

PCT/JP2016/001688

Publication Date:

September 29, 2016

Filing Date:

March 23, 2016

Export Citation:

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Assignee:

TOYO SEIKAN GROUP HOLDINGS LTD (JP)

International Classes:

G01N21/64; C12M1/00; C12N15/09

Domestic Patent References:

WO2013137247A1	2013-09-19
WO2013133283A1	2013-09-12

Foreign References:

JP2013072684A	2013-04-22
JP2009156824A	2009-07-16
JP2009204414A	2009-09-10
JP2005172840A	2005-06-30
JP2014063019A	2014-04-10

Attorney, Agent or Firm:

WATANABE, Kihei et al. (JP)
Kihei Watanabe (JP)

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