Title:
DRIVE DEVICE
Document Type and Number:
WIPO Patent Application WO/2017/006949
Kind Code:
A1
Abstract:
The purpose of the present invention is to diagnose an abnormality detection circuit for detecting an abnormality such as an overcurrent in a power semiconductor while minimizing any increase in the number of insulating elements additionally provided. This invention is provided with a drive circuit 11 for outputting a gate signal to the power semiconductor 6, an abnormality detection circuit 12 for detecting an abnormality in the power semiconductor 6, and a diagnosis signal application circuit 14 for applying a diagnosis signal to the abnormality detection circuit 12. The diagnosis signal application circuit 14 applies the diagnosis signal on the basis of the gate signal outputted by the drive circuit.
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Inventors:
INADA RYOICHI (JP)
HIROTSU TEPPEI (JP)
SAKAMOTO HIDEYUKI (JP)
YAHATA KOUICHI (JP)
KADOTA KEIJI (JP)
HIROTSU TEPPEI (JP)
SAKAMOTO HIDEYUKI (JP)
YAHATA KOUICHI (JP)
KADOTA KEIJI (JP)
Application Number:
PCT/JP2016/069958
Publication Date:
January 12, 2017
Filing Date:
July 06, 2016
Export Citation:
Assignee:
HITACHI AUTOMOTIVE SYSTEMS LTD (JP)
International Classes:
H02M1/00; H02M1/08; H02M7/48
Foreign References:
| JP2015002659A | 2015-01-05 | |||
| JP2010279125A | 2010-12-09 | |||
| JPH0829470A | 1996-02-02 | |||
| JPH04104067A | 1992-04-06 | |||
| JP2007104488A | 2007-04-19 |
Attorney, Agent or Firm:
INOUE Manabu et al. (JP)
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