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Patent Searching and Data


Title:
DUST-PROOF TEST APPARATUS AND DUST-PROOF TEST METHOD
Document Type and Number:
WIPO Patent Application WO/2018/214883
Kind Code:
A1
Abstract:
Disclosed is a dust-proof test apparatus, comprising a test box and a dust supply device, wherein the test box comprises a sample bin, the dust supply device is connected to the test box via a dust pipe, and the dust supply device is used for inputting dust into the sample bin under the action of compressed air. Further provided is a dust-proof test method. Using the dust-proof test apparatus and method provided in the embodiments of the present invention enables reliability growth testing to be conducted on an electronic product.

Inventors:
GAN HONG (CN)
ZHANG PAN (CN)
WU XIAOZHI (CN)
Application Number:
PCT/CN2018/087880
Publication Date:
November 29, 2018
Filing Date:
May 22, 2018
Export Citation:
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Assignee:
HUAWEI TECH CO LTD (CN)
International Classes:
G01N17/00; G01R31/00
Foreign References:
CN105043966A2015-11-11
US20080163704A12008-07-10
CN204008411U2014-12-10
CN201710376320A2017-05-25
Other References:
See also references of EP 3608654A4
Attorney, Agent or Firm:
SCIHEAD IP LAW FIRM (CN)
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