DYNAMIC CALIBRATION METHOD FOR ECHELLE SPECTROMETER FOR LASER INDUCED BREAKDOWN SPECTRUM COLLECTION

WIPO Patent Application WO/2018/184262

A1

A dynamic calibration method for an echelle spectrometer for laser induced breakdown spectrum collection, relating to the field of material component detection techniques, specifically comprising the following steps: S1: using an echelle spectrometer to collect a standard light source; S2: using a wavelength calibration function to obtain pixel coordinates (x̂, ŷ) corresponding to a spectral wavelength ŵ; S3: performing dynamic searching and filtering around the pixel coordinates (x̂, ŷ) to obtain a set D of pixel locations, adjusting all original intensity values in the set D to obtain F(I x, y ); S4: summing the adjusted intensity values F(I x, y ) to obtain a calibrated intensity value, thereby completing the dynamic calibration for the result of the echelle spectrometer. Said method overcomes the deficiency of an existing echelle spectrometer that performs calibration only before use and thus cannot solve the problem of spectral line drift during use, improves the absolute intensity of the wavelength, effectively decreases the detection limit of quantitative analysis, and meanwhile improves the precision of quantitative analysis for an element to be analyzed.

LI XIANGYOU (CN)
SHEN MENG (CN)
HAO ZHONGQI (CN)
YANG XINYAN (CN)
LI JIAMING (CN)
ZENG XIAOYAN (CN)
LU YONGFENG (CN)

PCT/CN2017/081641

October 11, 2018

April 24, 2017

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UNIV HUAZHONG SCIENCE TECH (CN)

G01N21/63

CN103518121A	2014-01-15
CN101750401A	2010-06-23
CN102830096A	2012-12-19
CN202661380U	2013-01-09
US6987564B2	2006-01-17
US20160069745A1	2016-03-10

HUAZHONG UNIVERSITY OF SCIENCE AND TECHNOLOGY PATENT AGENCY CENTER (CN)

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