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Patent Searching and Data


Title:
EDDY CURRENT INSPECTION DEVICE FOR NON-DESTRUCTIVE INSPECTION
Document Type and Number:
WIPO Patent Application WO/2019/017535
Kind Code:
A1
Abstract:
An eddy current inspection device for non-destructive inspection is disclosed. The present device comprises: a bobbin type coil inserted into a test piece, which is an object to be inspected for non-destructive inspection, and applying an induction current to the inner wall of the test piece; a reference coil inserted into a defect-free test piece, which is a reference of the test piece, and applying an induction current to the inner wall of the defect-free test piece; a cylindrical passive sensor array arranged in the bobbin type coil and including rows and columns; and a control module selecting at least one frequency among multiple frequencies, applying AC power to the bobbin type coil and the reference coil, generating a square wave signal having a different phase difference, and performing control such that first multiplication is performed on the applied signal and the square wave signal. Therefore, defect detection can be accurately performed.

Inventors:
LEE JIN YI (KR)
KIM JUNG MIN (KR)
SIM SUN BO (KR)
Application Number:
PCT/KR2017/013697
Publication Date:
January 24, 2019
Filing Date:
November 28, 2017
Export Citation:
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Assignee:
UNIV CHOSUN IACF (KR)
International Classes:
G01N27/90; G01D5/14
Foreign References:
KR20130130529A2013-12-02
JP2006145296A2006-06-08
US20110089937A12011-04-21
KR20120065243A2012-06-20
JPH10239282A1998-09-11
Attorney, Agent or Firm:
NAM & NAM WORLD PATENT & LAW FIRM (KR)
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