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Patent Searching and Data


Title:
EFFICIENT PHASE-THREE-DIMENSIONAL MAPPING METHOD AND SYSTEM BASED ON FRINGE PROJECTION PROFILOMETRY
Document Type and Number:
WIPO Patent Application WO/2018/119771
Kind Code:
A1
Abstract:
The present invention is applicable to the technical field of optical three-dimensional digital imaging. Provided is an efficient phase-three-dimensional mapping method based on fringe projection profilometry. The fringe projection profilometry is based on a binocular system, and the binocular system comprises a projection device and an imaging device. The method comprises: step S1, projecting, by using a projection device, a fringe sequence to the surface of an object to be measured, collecting, by an imaging device, a deformed fringe pattern modulated by the surface of the object to be measured, and computing phases of all pixels on an image of the imaging device according to the deformed fringe pattern; and step S2, searching for a phase-three-dimensional mapping coefficient corresponding to each pixel in a preset phase-three-dimensional mapping coefficient lookup table, and plugging the phase of each pixel and the corresponding phase-three-dimensional mapping coefficient into a phase-three-dimensional mapping function, so as to compute three-dimensional coordinates of an object point corresponding to each pixel on the image of the imaging device. By means of the method provided in the present invention, efficient three-dimensional reconstruction of the fringe projection profilometry can be implemented.

Inventors:
PENG XIANG (CN)
CAI ZEWEI (CN)
LIU XIAOLI (CN)
Application Number:
PCT/CN2016/112697
Publication Date:
July 05, 2018
Filing Date:
December 28, 2016
Export Citation:
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Assignee:
UNIV SHENZHEN (CN)
International Classes:
G01B11/25
Foreign References:
CN103994732A2014-08-20
CN102622747A2012-08-01
US8462207B22013-06-11
Attorney, Agent or Firm:
HENSEN INTELLECTUAL PROPERTY FIRM (CN)
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