ELECTRICAL CHARACTERISTIC MEASUREMENT DEVICE, ELECTRICAL CHARACTERISTIC MEASUREMENT SYSTEM, ELECTRICAL CHARACTERISTIC MEASUREMENT METHOD, AND ELECTRICAL CHARACTERISTIC MEASUREMENT PROGRAM FOR CAUSING COMPUTER TO IMPLEMENT SAID METHOD

Title:

Document Type and Number:

WIPO Patent Application WO/2016/132779

Kind Code:

A1

Abstract:

The present invention makes highly accurate electrical measurement possible regardless of the performance, and the like, of a measurement instrument. Provided is an electrical characteristic measurement device provided with a measurement unit for measuring an electrical characteristic of a biological sample at a plurality of frequencies and an allocation unit for allocating a number of measurements and/or a measurement amplitude to each frequency. When the electrical characteristic of the biological sample is measured, within the plurality of frequencies, frequencies that make the signal-to-noise ratio low and those that make the signal-to-noise ratio high are intentionally mixed, and as a result, highly accurate electrical measurement optimized for the purpose of the measurement is possible.

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Inventors:

HIDAKA ISAO (JP)

Application Number:

PCT/JP2016/050911

Publication Date:

August 25, 2016

Filing Date:

January 14, 2016

Export Citation:

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Assignee:

SONY CORP (JP)

International Classes:

G01N27/02; G01N27/22

Domestic Patent References:

WO2014115478A1

2014-07-31

Foreign References:

JPH05209912A	1993-08-20
JPH11352162A	1999-12-24
JPS6488376A	1989-04-03
JP2012518797A	2012-08-16

Other References: