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Patent Searching and Data


Title:
ELECTRICAL DEVICE, AND DIAGNOSTIC APPARATUS FOR ELECTRICAL DEVICE
Document Type and Number:
WIPO Patent Application WO/2018/061287
Kind Code:
A1
Abstract:
The purpose of the present invention is to make it possible to estimate the temperature of a semiconductor element using a simple structure. To do that, there are provided: one or a plurality of semiconductor elements (104, 106); drive circuits (107, 108) that receive a control signal (Va) that commands an on state or an off state of the semiconductor elements (104, 106), and drive the semiconductor elements (104, 106) on the basis of the control signal (Va); a DC voltage power supply (150) that gives output power to the semiconductor elements (104, 106); a detector (114) that detects a noise component (In) that is superimposed on the output of the DC voltage output supply, and is generated by the semiconductor elements; and a deviation time measuring unit (111) that measures deviation time, which is the difference between the timing when the control signal (Va) has commanded the off state, and the timing when the noise component (In) was generated.

Inventors:
OGAWA TAKASHI (JP)
SAKURAI NAOKI (JP)
Application Number:
PCT/JP2017/017712
Publication Date:
April 05, 2018
Filing Date:
May 10, 2017
Export Citation:
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Assignee:
HITACHI LTD (JP)
International Classes:
G01K7/00; H02M7/48; G01R31/26
Foreign References:
JPH07170724A1995-07-04
JPH1141077A1999-02-12
JP2009225541A2009-10-01
JP2016063667A2016-04-25
Other References:
See also references of EP 3522352A4
Attorney, Agent or Firm:
ISONO INTERNATIONAL PATENT OFFICE, P.C. (JP)
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