Title:
ELECTRICAL PROPERTY TESTING DEVICE AND TESTING METHOD FOR TOUCH ELECTRODE
Document Type and Number:
WIPO Patent Application WO/2017/036062
Kind Code:
A1
Abstract:
An electrical property testing device and testing method for a touch electrode. The electrical property testing device comprises: a capacitor forming unit (1) and a capacitor testing unit (2). The capacitor forming unit is configured to form a capacitive structure with a touch electrode (4) to be tested. The capacitor testing unit (2) is configured to obtain a capacitance value of the formed capacitive structure. By using the capacitor forming unit (1) to form a capacitive structure with a touch electrode (4) to be tested, and using the capacitor testing unit (2) to obtain a capacitance value of the capacitive structure, the present invention enables testing personnel to effectively and accurately evaluate electrical properties of the touch electrode (4) based on the obtained capacitance value of the capacitive structure.
Inventors:
CHEN QINGYOU (CN)
LI JI (CN)
CHEN JUN (CN)
ZHANG CHENG (CN)
LI JI (CN)
CHEN JUN (CN)
ZHANG CHENG (CN)
Application Number:
PCT/CN2016/070103
Publication Date:
March 09, 2017
Filing Date:
January 05, 2016
Export Citation:
Assignee:
BOE TECHNOLOGY GROUP CO LTD (CN)
HEFEI BOE OPTOELECTRONICS TECH (CN)
HEFEI BOE OPTOELECTRONICS TECH (CN)
International Classes:
G01R31/00
Foreign References:
| CN103675489A | 2014-03-26 | |||
| CN102508105A | 2012-06-20 | |||
| CN203444049U | 2014-02-19 | |||
| CN103941109A | 2014-07-23 | |||
| CN101846712A | 2010-09-29 | |||
| US20030062905A1 | 2003-04-03 |
Attorney, Agent or Firm:
TEE&HOWE INTELLECTUAL PROPERTY ATTORNEYS (CN)
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