Title:
ELECTRICAL TREE TEST METHOD, ELECTRODE STRUCTURE, AND ELECTRODE SETTING ASSEMBLY
Document Type and Number:
WIPO Patent Application WO/2017/109811
Kind Code:
A1
Abstract:
This electrical tree test method is a method for testing for electrical trees in an insulating member including mica insulation provided around an electrical conductor, and comprises: an assembly attaching step (S03) for attaching an electrode setting assembly to the outside of the mica insulation; an impregnation step (S04), after the assembly attaching step, for impregnating the mica insulation with synthetic resin; a removal step (S05), after the impregnation step (S04), for removing the entire electrode setting assembly except an electrode structure; a power supply connection step (S06), after the removal step (S05), for connecting the conductor and the electrode structure to a power supply in order to apply a voltage between the conductor and the electrode structure; and a voltage application step (S07), after the power supply connection step, for applying a voltage between the conductor and the electrode structure.
Inventors:
MURA KOTARO (JP)
YOSHIMITSU TETSUO (JP)
TSUDA TOSHIHIRO (JP)
YOSHIMITSU TETSUO (JP)
TSUDA TOSHIHIRO (JP)
Application Number:
PCT/JP2015/006343
Publication Date:
June 29, 2017
Filing Date:
December 21, 2015
Export Citation:
Assignee:
TOSHIBA MITSUBISHI-ELECTRIC IND SYSTEMS CORP (JP)
International Classes:
G01R31/12; G01N27/20
Foreign References:
| JP2012103158A | 2012-05-31 | |||
| JPH09105767A | 1997-04-22 | |||
| JPS57208006A | 1982-12-21 | |||
| JP2006134587A | 2006-05-25 |
Other References:
See also references of EP 3396395A4
Attorney, Agent or Firm:
SAKURA PATENT OFFICE, P.C. (JP)
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