Title:
ELECTRO-OPTIC PROBE, ELECTROMAGNETIC WAVE MEASURING APPARATUS, AND ELECTROMAGNETIC WAVE MEASURING METHOD
Document Type and Number:
WIPO Patent Application WO/2017/002782
Kind Code:
A1
Abstract:
Provided is an electro-optic probe (101) for detecting an electromagnetic wave, the electro-optic probe (101) being provided with an electro-optic crystal (52) and an optical fiber (16) optically coupled to the electro-optic crystal (52). The direction of a characteristic axis of the electro-optic crystal (52) and the polarization direction of light coming into the electro-optic crystal (52) from the optical fiber (16) are arranged to align with each other, or the characteristic axis of the electro-optic crystal (52) and a characteristic polarization direction of the optical fiber (16) are arranged to align with each other.
Inventors:
HISATAKE SHINTAROU (JP)
NAGATSUMA TADAO (JP)
UCHIDA HIROHISA (JP)
NAGATSUMA TADAO (JP)
UCHIDA HIROHISA (JP)
Application Number:
PCT/JP2016/069076
Publication Date:
January 05, 2017
Filing Date:
June 28, 2016
Export Citation:
Assignee:
UNIV OSAKA (JP)
International Classes:
G01R29/08
Foreign References:
| JP2005201819A | 2005-07-28 | |||
| JP2009025053A | 2009-02-05 |
Other References:
See also references of EP 3315979A4
Attorney, Agent or Firm:
ONEDEE IP PARTNERS (JP)
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