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Title:
ELECTRODE PATTERN TEST APPARATUS
Document Type and Number:
WIPO Patent Application WO/2013/119014
Kind Code:
A1
Abstract:
Disclosed is an electrode pattern test apparatus capable of performing an electrical test on an electrode pattern formed on a high resolution glass panel in a stable and quick manner. The electrode pattern test apparatus performs an electrical test simultaneously on an active area and on a fan out area of an electrode pattern through a single scanning, thus not only detecting whether the electrode pattern is open or short-circuited but also detecting an open point or a short point in a quick and accurate manner. As a result, time taken for testing an electrode pattern is shortened to achieve improved production efficiency of a glass panel.

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Inventors:
KIM CHUL-JU (KR)
PARK JI-KUN (KR)
PARK JUN-HEE (KR)
KIM JIN-YOUL (KR)
YAMAOKA SHUJI (JP)
Application Number:
PCT/KR2013/000906
Publication Date:
August 15, 2013
Filing Date:
February 05, 2013
Export Citation:
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Assignee:
RORZE SYSTEMS CORP (KR)
International Classes:
G01R1/067; G01R31/28; G01R31/50
Foreign References:
KR20100028275A2010-03-12
KR20080008689A2008-01-24
KR20050064964A2005-06-29
Attorney, Agent or Firm:
C.M. PATENT & LAW FIRM, LLP et al. (KR)
씨엠 특허법인 (KR)
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Claims:



 
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