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Title:
ELECTROMAGNETIC FIELD PROBE
Document Type and Number:
WIPO Patent Application WO/2016/189999
Kind Code:
A1
Abstract:
An electromagnetic field probe is provided with linear conductors (1), (2) disposed orthogonally so as not to short circuit, connection conductors (3), (4) disposed so as to connect the ends of the linear conductors (1), (2) to each other and form a continuous pair of loops, and a pair of terminals (5) provided such that one part in the pair of loops is disconnected.

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Inventors:
KOBAYASHI TSUYOSHI (JP)
MIYAZAKI CHIHARU (JP)
Application Number:
PCT/JP2016/062324
Publication Date:
December 01, 2016
Filing Date:
April 19, 2016
Export Citation:
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Assignee:
MITSUBISHI ELECTRIC CORP (JP)
International Classes:
G01R29/08; H01Q1/38; H01Q7/00
Foreign References:
JP2010078597A2010-04-08
JP2005351890A2005-12-22
JP2011064590A2011-03-31
JP2015052470A2015-03-19
JP2004199226A2004-07-15
Attorney, Agent or Firm:
TAZAWA, Hideaki et al. (JP)
Hideaki Tazawa (JP)
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