Title:
ELECTROMAGNETIC FIELD PROBE
Document Type and Number:
WIPO Patent Application WO/2018/138868
Kind Code:
A1
Abstract:
This electromagnetic field probe is characterized by being provided with a series of conductor lines that have 2N (N being an integer 3 or higher) conductors extending radially from a near-center of the electromagnetic field probe, have terminals at two ends formed by interconnection of an end section of a conductor included in the 2N conductors and an end section of another conductor included in the 2N conductors, and have no short-circuit in the middle, two conductors included in the 2N conductors being arranged at positions facing one another across the near-center, and the end sections, of the two conductors, that are close to the near-center being connected to one another. According to this electromagnetic field probe, it is possible to detect currents without changing the orientation of the probe relative to substrate wirings arranged in various directions such as 0°, 45°, 90°, or 135°.
Inventors:
KOBAYASHI TSUYOSHI (JP)
MIYAZAKI CHIHARU (JP)
MIYAZAKI CHIHARU (JP)
Application Number:
PCT/JP2017/002923
Publication Date:
August 02, 2018
Filing Date:
January 27, 2017
Export Citation:
Assignee:
MITSUBISHI ELECTRIC CORP (JP)
International Classes:
G01R29/08; H01Q7/00
Domestic Patent References:
| WO2016189999A1 | 2016-12-01 |
Foreign References:
| JP2010008282A | 2010-01-14 | |||
| JPH1144719A | 1999-02-16 | |||
| JP2005351890A | 2005-12-22 |
Attorney, Agent or Firm:
MURAKAMI, Kanako et al. (JP)
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