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Patent Searching and Data


Title:
ELECTROMAGNETIC-WAVE DETECTING SYSTEM
Document Type and Number:
WIPO Patent Application WO/2020/090783
Kind Code:
A1
Abstract:
The present invention provides an electromagnetic-wave detecting system including: a production unit that produces electromagnetic waves; an emission unit that is disposed away from the production unit and that emits the electromagnetic waves produced by the production unit toward an object; a detection unit that detects the electromagnetic waves reflected at the object; a generation unit that generates a bias voltage to be applied to the detection unit; a waveguide unit that is disposed between the production unit and the emission unit and that guides, to the detection unit, some electromagnetic waves of the electromagnetic waves produced by the production unit; and a control unit that controls the bias voltage on the basis of a result of detection of said some electromagnetic waves detected by the detection unit.

Inventors:
TANAKA HIROYUKI (JP)
Application Number:
PCT/JP2019/042277
Publication Date:
May 07, 2020
Filing Date:
October 29, 2019
Export Citation:
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Assignee:
PIONEER CORP (JP)
International Classes:
G01R29/08
Domestic Patent References:
WO2017104020A12017-06-22
Foreign References:
JP2003529760A2003-10-07
JP2009145312A2009-07-02
JP2004354246A2004-12-16
JP2015117964A2015-06-25
JP2017075923A2017-04-20
US20180113321A12018-04-26
Attorney, Agent or Firm:
HAYAMI Shinji et al. (JP)
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