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Title:
ELECTROMAGNETIC WAVE MEASUREMENT DEVICE FOR ESTIMATING NEAR-FIELD ELECTRIC FIELD BY USING FAR-FIELD ELECTRIC FIELD
Document Type and Number:
WIPO Patent Application WO/2022/169033
Kind Code:
A1
Abstract:
The present invention relates to an electromagnetic wave measurement device for estimating a near-field electric field by using a far-field electric field, and provides an electromagnetic wave measurement device for estimating a near-field electric field by using a far-field electric field, in which a phase is restored by using a magnitude of a far-field electric field strength and phase information is moved from a long distance to a short distance by using restored phase information. Specifically, the present invention comprises: a magnitude measurement part for performing XY-axis scanning up, down, left, and right on a reference measurement plane at a point of Zo in a long-distance area from a target antenna and on each of target measurement planes at points spaced apart from the reference measurement plane by using an electrical field probe, and receiving measured electronic field strength magnitude for each coordinate (x, y) of the reference measurement plane and each of the target measurement planes; and a phase restoration part for configuring a predetermined phase function on the reference measurement plane, generating a complex function value in a phaser form by multiplying electronic field strength magnitude measured at a specific position of the reference measurement plane by the phase function, and generating a new complex function of a movement target point along the vertical axis (z-axis), which is a moving axis of electromagnetic waves, by performing back projection or forward projection of the generated complex function value toward each of the target measurement planes.

Inventors:
KAHNG SUNG TEK (KR)
LEE CHANG HYEONG (KR)
PARK HEE JUN (KR)
Application Number:
PCT/KR2021/006753
Publication Date:
August 11, 2022
Filing Date:
May 31, 2021
Export Citation:
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Assignee:
UNIV INCHEON IND ACAD COOP (KR)
International Classes:
G01R29/08; G01R1/067; G01R23/16; G01R29/12
Foreign References:
JP2019219255A2019-12-26
JP2006275967A2006-10-12
KR20100049955A2010-05-13
US20060012530A12006-01-19
JP2017207464A2017-11-24
Attorney, Agent or Firm:
HMP IP GROUP (KR)
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