Title:
ELECTROMAGNETIC WAVE MEASURING DEVICE FOR SELECTIVELY MEASURING ELECTROMAGNETIC WAVES
Document Type and Number:
WIPO Patent Application WO/2013/176373
Kind Code:
A1
Abstract:
Disclosed is an electromagnetic wave measuring device for selectively measuring at least one electromagnetic wave from among a plurality of electromagnetic waves for wireless communication. One embodiment includes: a wireless communication unit; an electromagnetic wave measuring unit for measuring at least one electromagnetic wave; and a controller for controlling the electromagnetic wave measuring unit for selectively measuring at least one electromagnetic wave based on electromagnetic waves for wireless communication.
Inventors:
YOON JIN HYUK (KR)
NAM EYEE HYUN (KR)
MIN SANG LYUL (KR)
NAM EYEE HYUN (KR)
MIN SANG LYUL (KR)
Application Number:
PCT/KR2013/000385
Publication Date:
November 28, 2013
Filing Date:
January 18, 2013
Export Citation:
Assignee:
SNU R&DB FOUNDATION (KR)
International Classes:
G01R29/00; G01R29/08
Foreign References:
| JP2005038087A | 2005-02-10 | |||
| KR100408935B1 | 2003-12-11 | |||
| JP2000065876A | 2000-03-03 | |||
| JP2000224176A | 2000-08-11 | |||
| KR100603769B1 | 2006-07-24 |
Attorney, Agent or Firm:
MUHANN PATENT & LAW FIRM (KR)
특허법인 무한 (KR)
특허법인 무한 (KR)
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