Title:
ELECTRONIC CIRCUIT AND METHOD FOR TESTING SAME
Document Type and Number:
WIPO Patent Application WO/2023/233472
Kind Code:
A1
Abstract:
Provided is an electronic circuit which has a functional circuit and is capable of preventing a mistaken test mode operation from occurring when used in a shopping market, etc. An electronic circuit according to the present invention is equipped with a functional circuit which has a prescribed function, and a test circuit for testing in order to debug the functional circuit. The electronic circuit is equipped with: an input circuit for decoding an enable signal for switching the electronic circuit to an operational state, and outputting the decoded enable signal to the functional circuit; a test signal generator for producing a trigger signal for a test signal on the basis of a signal change included in the enable signal; and a computing element for computing a NOR operation of the decoded enable signal and the trigger signal, and outputting the signal from the computing results to the test circuit as a test signal for instructing so as to execute said test.
Inventors:
TANJI KAGEHITO (JP)
MATSUSHITA SHIRO (JP)
MATSUSHITA SHIRO (JP)
Application Number:
PCT/JP2022/021960
Publication Date:
December 07, 2023
Filing Date:
May 30, 2022
Export Citation:
Assignee:
NISSHINBO MICRO DEVICES INC (JP)
International Classes:
G01R31/28
Foreign References:
| JP2011066473A | 2011-03-31 | |||
| JP2008065862A | 2008-03-21 | |||
| JP2002015599A | 2002-01-18 | |||
| JP2014137272A | 2014-07-28 | |||
| JP2004171730A | 2004-06-17 | |||
| JP2019514094A | 2019-05-30 | |||
| JP2007018710A | 2007-01-25 | |||
| US20150285858A1 | 2015-10-08 |
Attorney, Agent or Firm:
YAMAO, Norihito et al. (JP)
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