Title:
ELECTRONIC COMPONENT HANDLING APPARATUS, METHOD FOR OPERATING THE ELECTRONIC COMPONENT HANDLING APPARATUS, TEST TRAY AND PUSHER
Document Type and Number:
WIPO Patent Application WO/2008/020523
Kind Code:
A1
Abstract:
A handler (1) transfers a test tray (500) storing a plurality of IC devices (2)
to the positions of a plurality of sockets (40) on test section units (Hi-Fix)
(50) arranged on a test head (5). A plurality of the test section units have at
least different size or arrangement (including pitch and flat surface direction)
or the number of the sockets (40). The handler (1) is applicable to any test section
unit (50) as the outer shapes of the test section units (50) are made substantially
the same. The handler (1) is applicable to a plurality of the test section units
(50), which have different socket size or arrangement or number, by using the
same handler.
Inventors:
ITO, Akihiko (32-1 Asahicho 1-chome, Nerima-k, Tokyo 71, 1790071, JP)
伊藤 明彦 (〒71 東京都練馬区旭町１丁目３２番１号 株式会社アドバンテスト内 Tokyo, 1790071, JP)
YAMASHITA, Kazuyuki (32-1 Asahicho 1-chome, Nerima-k, Tokyo 71, 1790071, JP)
伊藤 明彦 (〒71 東京都練馬区旭町１丁目３２番１号 株式会社アドバンテスト内 Tokyo, 1790071, JP)
YAMASHITA, Kazuyuki (32-1 Asahicho 1-chome, Nerima-k, Tokyo 71, 1790071, JP)
Application Number:
JP2007/064170
Publication Date:
February 21, 2008
Filing Date:
July 18, 2007
Export Citation:
Assignee:
ADVANTEST CORPORATION (32-1, Asahicho 1-chome Nerima-k, Tokyo 71, 1790071, JP)
株式会社アドバンテスト (〒71 東京都練馬区旭町１丁目３２番１号 Tokyo, 1790071, JP)
ITO, Akihiko (32-1 Asahicho 1-chome, Nerima-k, Tokyo 71, 1790071, JP)
伊藤 明彦 (〒71 東京都練馬区旭町１丁目３２番１号 株式会社アドバンテスト内 Tokyo, 1790071, JP)
株式会社アドバンテスト (〒71 東京都練馬区旭町１丁目３２番１号 Tokyo, 1790071, JP)
ITO, Akihiko (32-1 Asahicho 1-chome, Nerima-k, Tokyo 71, 1790071, JP)
伊藤 明彦 (〒71 東京都練馬区旭町１丁目３２番１号 株式会社アドバンテスト内 Tokyo, 1790071, JP)
International Classes:
G01R31/26; G01R31/26
Attorney, Agent or Firm:
HAYAKAWA, Yuzi et al. (Arcadia Patent Firm, Suite 501 Hikawa-Annex No.2,9-5, Akasaka 6-chom, Minato-ku Tokyo 52, 1070052, JP)